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» The Impact of Bias Row Noise to Photometric Accuracy: Case Study Based on a Scientific CMOS Detector
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The Impact of Bias Row Noise to Photometric Accuracy: Case Study Based on a Scientific CMOS Detector
Title
The Impact of Bias Row Noise to Photometric Accuracy: Case Study Based on a Scientific CMOS Detector
Publication Type
Journal Article
Authors
Shao, L, Zhan, H, Liu, C, Chi, H, Luo, Q, Mu, H, Shi, W
Language
English